Jitter measurement apparatus, jitter measurement method,...

Details Jitter measurement apparatus, jitter measurement method,... Jitter measurement apparatus, jitter measurement method,...

2011-05-17

2011-05-17

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S179000

Reexamination Certificate

active

07945405

ABSTRACT:
Provided is a jitter measurement apparatus, including a sampling section that samples a signal under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values sampled by the sampling section, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform, and a statistical value calculating section that calculates a statistical value of the timing distribution. The sampling section may sample the signal under measurement having the cycle T a certain number of times N while the signal under measurement repeats for M cycles, where M and N are coprime.

REFERENCES:
patent: 7715512 (2010-05-01), Ichiyama et al.
patent: 2009/0281752 (2009-11-01), Ishida
Article Titled “A Test Case for 3 Gbps Serial Attached SCSI (SAS)” jointly authored by Cai et al., in Proc. IEEE International Test Conference, Austin, TX, Nov. 8-10, 2005.
Article Titled “Measuring Jitter of High Speed Data Channels Using Undersampling Techniques” jointly authored by Dalal et al., in Proc. IEEE International Test Conference, Washington, D.C., Oct. 18-23, 1998 (pp. 814-818).

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