Jitter measurement algorithm using locally in-order strobes

Details Jitter measurement algorithm using locally in-order strobes Jitter measurement algorithm using locally in-order strobes

2005-11-10

2010-02-23

Ghayour, Mohammad H (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S371000, C702S069000, C324S750010, C324S755090, C324S759030, C324S763010, C324S764010

Reexamination Certificate

active

07668235

ABSTRACT:
A method of jitter measurement is provided and includes sampling a device-under-test (DUT) output signal, having a repeating pattern, using an asynchronous clock over a desired period of time and mapping the samples onto a single period of the repeating pattern. Each period of the repeating pattern is sampled at least twice. A sampling frequency of the asynchronous clock is based on user inputs. Sampling the DUT signal comprises capturing logical state information representing each edge of a single period of the DUT signal at least once. The method further includes, separating the samples into subsets and mapping the sample subsets onto a single period of the repeating pattern wherein the samples within a particular subset are mapped to a set of times which are in the same order as in which the samples were obtained, processing the samples within each subset independently of samples in other subsets, and combining results of the processed subsets and processing the combined results of the subsets.

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Hong et al. (“An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling,” VLSI Test Symposium, 2005. Proceeding. 23rd IEEE May 1-5, 2005, pp. 123-130).
Hong, D., “An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling”, May 2005, VLSI Test Symposium 2005, 23rd. p. 123-130.
Hong et al., “An Efficient Random Jitter Measurement Techinique Using Fast Comparator Sampling”, “23rd IEEE VLSI Test Symposium”, 2005, pp. 123-130, Publisher: IEEE, Published in: Piscataway, NJ.
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