Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-16
2005-08-16
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S180000, C375S226000
Reexamination Certificate
active
06931335
ABSTRACT:
For determining a jitter value for a digital data signal, a jitter histogram determined for the digital data signal is substantially approximated using n normal distribution functions. The two outermost normal distribution functions are determine, and the jitter value is derived from a distance between the mean values of the two outmost distribution functions.
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Hoff Marc S.
West Jeffrey R.
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