Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-02-15
2011-02-15
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07890279
ABSTRACT:
A phase-locked loop is characterized by analyzing phase noise in its output signal while known levels of input phase noise are provided. The resulting data provides intrinsic phase noise and gain of the phase-locked loop. These values provide a general relationship between input phase noise and output phase noise for the phase-locked loop, which allows estimation of output phase noise corresponding to a given level of input phase noise, and allows estimation of input phase noise corresponding to a given level of output phase noise.
REFERENCES:
patent: 2006/0141963 (2006-06-01), Maxim et al.
Chow et al., “A Jitter Estimation Method for Cascaded, Programmable Phase-Locked Loops.”DesignCon 2008. Feb. 2008.
Daniel Chow, “Analysis of Crosstalk Effects on Jitter in Transceivers.”DesignCon 2008. Feb. 2008.
Chow Daniel Tun Lai
Lim Lik Huay
Tsui Vincent K.
Wong Man On
Wong San
Altera Corporation
Raymond Edward
Weaver Austin Villeneuve & Sampson LLP
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