Jitter analyzer

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Phase comparison

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Details

324 7613, F24F 700

Patent

active

055571964

DESCRIPTION:

BRIEF SUMMARY
TECHNICAL FIELD

The present invention generally relates to a jitter analyzer for analyzing a pulse width fluctuation, what is called a jitter or jitters, of a pulse-like signal to be measured. More particularly, the present invention relates to a jitter analyzer which is capable of continuously measuring various quantities (parameters) in the domain of time/frequency of a pulse-like signal to be measured including a discontinuous burst signal, for example, a period, a frequency, a pulse width, a duty ratio, a time interval, a phase or the like of the pulse-like signal, as well as manifesting a time on acquisition of each data and analyzing a statistical operation, a distribution of the frequency (number of occurrences), a variation relative to the time elapsed, and a frequency component of each of these parameters, and also, relates to a jitter analyzer with a time window trigger function which is capable of, in continuous measurement of such various parameters, detecting a specified section or segment in a signal to be measured and continuously acquiring data immediately after the detection of the specified section to measure them, or inhibiting the analyzer from measuring data immediately after the detection of the specified section, and further, relates to a jitter analyzer with a wander analyzing function which is capable of continuously measuring various parameters in the domain of time/frequency of a pulse-like signal to be measured, for example, a period, a time interval or the like of the pulse-like signal and analyzing with a high accuracy and efficiently an amplitude and frequency components of a jitter and a wander which is a variation in phase over a long time based on MTIE (maximum time interval error) from the measured values of the parameters.


BACKGROUND ART

There have been previously proposed various kinds of time/frequency measuring apparatus for continuously measuring various parameters in the domain of time/frequency of a pulse signal to be measured, for example, period, frequency, pulse width, duty ratio, time interval, phase or the like of the pulse signal and analyzing a pulse width fluctuation, namely, a jitter, of the pulse signal to be measured. However, the prior art measuring apparatus have problems that the accuracy of measurement is low, the circuit composition or construction is complicated, the troublesome control is required, etc.
To this end, the assignee of the present application filed a patent application for an invention entitled "jitter analyzer" for analyzing a jitter contained in an input pulse (see Japanese Patent Application Public Disclosure No. 107287/1993 or U.S. Pat. No. 5,293,520). The jitter analyzer disclosed therein is a kind of time interval analyzer for calculating a period and a pulse width of a pulse signal inputted as a signal to be measured as well as analyzing a component of a jitter contained in the pulse width by effecting the fast Fourier transform (hereinafter also referred to as FFT) of the calculated data of pulse width and analyzing the results. As to the detailed explanation thereof, see the above-mentioned Japanese Patent Application Public Disclosure No. 107287/1993 or U.S. Pat. No. 5,293,520.
Also, the assignee of the present application filed a utility model application for an invention entitled "an apparatus for continuously measuring pulse widths" on Apr. 28, 1993 (Japanese Utility Model Application No. 27920/1993). The pulse width measuring apparatus disclosed therein can continuously measure pulse widths of input pulses without being restricted by the duty ratios thereof and make higher the limitation of measurable frequency.
Recently, digital communications have been utilized by persons and as a result communications utilizing a discontinuous burst signal as represented by a TDMA (time division multiple access) communication system have prospered. Therefore, it has become important to analyze various parameters in the domain of time/frequency of the burst signal, that is, a jitter contained in the burst signal.
In digital communi

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