Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-03-06
1996-09-24
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324755, G01R 3102
Patent
active
055594433
ABSTRACT:
A jig for measuring the characteristics of various semiconductors has three main elements including a first circuit board to be connected to a tester for measuring the characteristics of the semiconductor, a second circuit board to be connected to the semiconductor and an intermediate board located between the first and second circuit boards. The first and second circuit boards are electrically connected together through springy pins. These pins, secured to the first circuit board, extend through the intermediate board via through holes to contact with terminals located in the second circuit board. When measuring the characteristics of various semiconductors it is possible to use the jig by replacing only the second circuit board with a board adapted to the particular semiconductor being measured without replacing the other elements of the jig.
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Hasuda Syuuichi
Nakamura Mitsuo
Namai Eisaku
Yamada Syuuzou
Yamazaki Noboru
Hitachi Chemical Company Ltd.
Nguyen Vinh P.
Yamada Den-On Co., Ltd.
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