Jig for measuring the characteristics of a semiconductor, manufa

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324755, G01R 3102

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active

055594433

ABSTRACT:
A jig for measuring the characteristics of various semiconductors has three main elements including a first circuit board to be connected to a tester for measuring the characteristics of the semiconductor, a second circuit board to be connected to the semiconductor and an intermediate board located between the first and second circuit boards. The first and second circuit boards are electrically connected together through springy pins. These pins, secured to the first circuit board, extend through the intermediate board via through holes to contact with terminals located in the second circuit board. When measuring the characteristics of various semiconductors it is possible to use the jig by replacing only the second circuit board with a board adapted to the particular semiconductor being measured without replacing the other elements of the jig.

REFERENCES:
patent: 4614386 (1986-09-01), Driller et al.
patent: 4833402 (1989-05-01), Boegh-Peterson
patent: 4835465 (1989-05-01), Gergin
patent: 4870356 (1989-09-01), Tingley
patent: 4912401 (1990-03-01), Nady, II et al.
patent: 4922190 (1990-05-01), Reinholz
patent: 5101149 (1992-03-01), Adams et al.
Patent Abstracts Of Japan, vol. 16, No. 272 (E-1246), 11 Aug. 1992.
Patent Abstracts Of Japan, vol. 17, No. 684 (P-1661), 15 Dec. 1993.
Patent Abstracts Of Japan, vol. 14, No. 61 (P-1001), 5 Feb. 1990.
Patent Abstracts Of Japan, vol. 13, No. 517 (P-962) 20 Nov. 1989.

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