Jig for Kelvin test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07573279

ABSTRACT:
A jig for Kelvin Test includes a first probe and a second probe which are arranged in parallel in a socket comprised of insulating material. Probes include a conductive tube and a conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding axially outward from the tube. The tube contains a coil spring adapted to elastically urge the plunger outward. The first probe is used for supplying electric current to a terminal of an electronic component to be tested. The second probe is used for monitoring electric voltage of the terminal. A first cross section of the tube of the first probe which is perpendicular to the axial direction is greater than a second cross section of the tube of the second probe which is perpendicular to the axial direction. The plunger is brought into elastic contact with the terminal.

REFERENCES:
patent: 6218846 (2001-04-01), Ludwig et al.
patent: 6411112 (2002-06-01), Das et al.
patent: 6743043 (2004-06-01), Yamada
patent: 7102373 (2006-09-01), Yoshida
patent: 7271606 (2007-09-01), Tang et al.
patent: 7298153 (2007-11-01), Farris et al.
patent: 61-48372 (1986-04-01), None
patent: 3-122370 (1991-12-01), None
patent: 2005-062100 (2005-03-01), None
patent: 2006-62100 (2005-03-01), None

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