Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-04-05
2005-04-05
Ahmed, Samir (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C356S399000, C228S105000
Reexamination Certificate
active
06876761
ABSTRACT:
A calibration jig for a component recognition device and a component recognition calibration method using the jig which can stabilize the mounting accuracy of a component to a to-be-mounted object and improve amount quality. An opening is formed at a to-be-picked up face of the calibration jig. A predetermined position of the calibration jig is recognized on the basis of the contrast between the picked-up face and the opening. The position of the calibration jig can be recognized with higher accuracy, so that a resolution of the component recognition device, etc. can be obtained with a higher degree of accuracy. Mount accuracy of the component to the object is thus stabilized and mount quality is improved.
REFERENCES:
patent: 5667129 (1997-09-01), Morita et al.
patent: 6138892 (2000-10-01), Kim et al.
patent: 6-85494 (1994-03-01), None
Kabeshita Akira
Kitamura Naoyuki
Mori Kazuo
Okuda Osamu
Tanabe Atsushi
Ahmed Samir
Matsushita Electric - Industrial Co., Ltd.
Wenderoth , Lind & Ponack, L.L.P.
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