Jig device for transporting and testing integrated circuit chip

Details Jig device for transporting and testing integrated circuit chip Jig device for transporting and testing integrated circuit chip

2008-07-22

2008-07-22

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010, C324S754090

Reexamination Certificate

active

07402995

ABSTRACT:
A novel jig device useful for transporting and testing an IC chip is disclosed. The jig device comprises a main jig body, having a holding part onto which the IC chip to be tested is attracted and held and at least one suction path is formed, and at least one contact probe arranged in the suction path of the main jig body. The main jig body comprises preferably a base part and front head part. The contact probe connects electronically between a terminal of the IC chip held at the holding part and an electrode of circuit board of tester.

REFERENCES:
patent: 4496903 (1985-01-01), Paulinski
patent: 5500605 (1996-03-01), Chang
patent: 5656942 (1997-08-01), Watts et al.
patent: 6046597 (2000-04-01), Barabi
patent: 6229322 (2001-05-01), Hembree
patent: 6893069 (2005-05-01), Graham
patent: 07-294600 (1995-10-01), None

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