Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2008-01-01
2008-01-01
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S144000
Reexamination Certificate
active
07314775
ABSTRACT:
The present invention provides a power-thrifty IT-CCD having a charge transfer electrode area thinned for improving the light reception efficiency of a photoelectric conversion section and being capable of executing high-speed and high-sensitivity transfer without lowering withstand voltage between charge transfer electrodes. A first insulation film is formed on the surface of a silicon substrate, and inter-electrode insulation films made of silicon oxide films and charge transfer electrodes made of polycrystalline silicon films are formed on the surface of the first insulation film. The inter-electrode insulation films are formed from side walls of the polycrystalline silicon films.
REFERENCES:
patent: 5286669 (1994-02-01), Maeda et al.
patent: 6090640 (2000-07-01), Ogawa
patent: 6165908 (2000-12-01), Hatano et al.
patent: 2002/0075391 (2002-06-01), Shizukuishi
patent: 11-31812 (1999-02-01), None
Azumi Teiji
Momose Takaaki
Birch & Stewart Kolasch & Birch, LLP
FUJIFILM Corporation
Pham Long
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