Isolated junction structure and method of manufacture

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S294000, C438S297000, C438S411000, C438S422000, C438S723000, C438S724000, C438S756000, C438S757000

Reexamination Certificate

active

07045468

ABSTRACT:
A MOSFET structure in which the channel region is contiguous with the semiconductor substrate while the source and drain junctions are substantially isolated from the substrate, includes a dielectric volume formed adjacent and subjacent to portions of the source and drain regions.In a further aspect of the invention, a process for forming an isolated junction in a bulk semiconductor includes forming a dielectric volume adjacent and subjacent to portions of the source and drain regions.

REFERENCES:
patent: 4503451 (1985-03-01), Lund et al.
patent: 4803173 (1989-02-01), Sill et al.
patent: 4888300 (1989-12-01), Burton
patent: 5578518 (1996-11-01), Koike et al.
patent: 5773847 (1998-06-01), Hayakawa
patent: 5972758 (1999-10-01), Liang
patent: 6028333 (2000-02-01), Yamazaki et al.
patent: 6268637 (2001-07-01), Gardner et al.
Streetman, Solid State Electronic Devices, 1990, Prentice Hall, 3rd ed., pp. 300-301, 324.
Wolf et al., Silicon Processing for the VLSI Era, 1986, Lattice Press, vol. 1, pp. 280-281.

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