Isolated Germanium nanowire on Silicon fin

Active solid-state devices (e.g. – transistors – solid-state diode – Point contact device

Reexamination Certificate

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C438S197000, C438S149000, C438S151000, C438S176000, C438S198000, C438S211000, C438S257000, C438S588000, C438S283000, C438S142000, C438S195000, C438S213000, C438S229000, C257S066000, C257S072000, C257SE21179, C257S347000, C257S331000, C257S250000, C257SE27112, C257SE29264, C257SE29275

Reexamination Certificate

active

07851790

ABSTRACT:
The present invention describes a method of and an apparatus for providing a wafer, the wafer including Silicon; etching trenches in the wafer to form Silicon fins; filling Silicon Oxide in the trenches; planarizing the Silicon Oxide; recessing the Silicon Oxide to a first thickness to form exposed Silicon pedestals from the Silicon fins; depositing SiGe over the exposed Silicon pedestal; recessing the Silicon Oxide to a second thickness; undercutting the exposed Silicon pedestals to form necked-in Silicon pedestals; oxidizing thermally and annealing the SiGe; and forming Germanium nanowires.

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