Active solid-state devices (e.g. – transistors – solid-state diode – Point contact device
Reexamination Certificate
2008-12-30
2010-12-14
Toledo, Fernando L (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Point contact device
C438S197000, C438S149000, C438S151000, C438S176000, C438S198000, C438S211000, C438S257000, C438S588000, C438S283000, C438S142000, C438S195000, C438S213000, C438S229000, C257S066000, C257S072000, C257SE21179, C257S347000, C257S331000, C257S250000, C257SE27112, C257SE29264, C257SE29275
Reexamination Certificate
active
07851790
ABSTRACT:
The present invention describes a method of and an apparatus for providing a wafer, the wafer including Silicon; etching trenches in the wafer to form Silicon fins; filling Silicon Oxide in the trenches; planarizing the Silicon Oxide; recessing the Silicon Oxide to a first thickness to form exposed Silicon pedestals from the Silicon fins; depositing SiGe over the exposed Silicon pedestal; recessing the Silicon Oxide to a second thickness; undercutting the exposed Silicon pedestals to form necked-in Silicon pedestals; oxidizing thermally and annealing the SiGe; and forming Germanium nanowires.
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Chau Robert
Jin Been-Yih
Pillarisetty Ravi
Rachmady Willy
Intel Corporation
Singal Ankush k
Toledo Fernando L
Winkle, PLLC
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