Isogrammetric analysis method for high-yield processes

Details Isogrammetric analysis method for high-yield processes Isogrammetric analysis method for high-yield processes

1995-04-03

1998-02-03

Voeltz, Emanuel T.

Boots, shoes, and leggings

364552, 36455101, 36446816, 36446817, G06F 1900

Patent

active

057151814

ABSTRACT:
A method is provided for process monitoring by statistical measurement of level-of-defectives performance in manufacturing and other processes. Statistical performance data functions of mean-value shift and deviation ratio are plotted on an isogrammetric chart for off-line analysis or, alternatively, are entered into a computer that has been programmed with the isogrammetric format. The resultant information revels the probable process yield and is useful to certify quality of performance in direct terms of level of defectives being produced. The method is particularly useful for high-yield processes where statistical sampling and inspection methods tend to miss the relatively few defectives and statistical process control (SPC) criteria appear to indicate that a manufacturing process is "in control".

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patent: 5257206 (1993-10-01), Hanson
patent: 5311759 (1994-05-01), Mangrulkar et al.
patent: 5339257 (1994-08-01), Layden et al.
patent: 5440478 (1995-08-01), Fisher et al.

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