Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-06-26
1994-07-05
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01B 902
Patent
active
053272200
ABSTRACT:
An apparatus and method for testing variations in thicknesses of an optical part comprising an interferometer having a monochromatic light source (laser) which focuses a probe beam into the optical part being tested and detects a standing fringe pattern (Newton Fringes) arising through the interaction of two wavefronts produced by the reflection off the front and back surfaces of the optical part. These fringes may be circular or parallel depending upon the optical power of the probe beam. By observing the expansion and contractions of the interference rings, variations in the thickness of the part can be determined. By counting the number of interference peaks produced at the center of the fringe pattern, during relative movement between the optical part and the beam, a direct measurement of the optical part's thickness variations can be made. The direction of the thickness change is monitored by observing the slope of the intensity variation at the first ring of the interference pattern. A complete mapping of the variations in thickness of the part can be generated.
REFERENCES:
patent: 4815856 (1989-03-01), Bruce
Dwyer Joseph R.
Kim Robert
O.C.A. Applied Optics, Inc.
Turner Samuel A.
LandOfFree
IR interferometric apparatus and method for determining the thic does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with IR interferometric apparatus and method for determining the thic, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and IR interferometric apparatus and method for determining the thic will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-799796