Electricity: measuring and testing – Using ionization effects
Patent
1990-04-11
1992-07-07
Strecker, Gerard R.
Electricity: measuring and testing
Using ionization effects
324462, 3133631, G01L 2132, H05H 1500
Patent
active
051286173
ABSTRACT:
An ionization gauge and controller therefor where the gauge has a sensitivity which is reproducible gauge to gauge and stable over time in the same gauge. An ionization gauge with a very much lower and a somewhat higher pressure limit than prior art gauges is also disclosed. Elements are also described for launching all electrons in a tight beam in Bayard-Alpert type geometry, so that all the conditions for reproducible and stable sensitivity are satisfied. Elements are also described for collecting all electrons at low energy so that soft X-ray production is negligible.
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Paul Redhead et al., "Physical Basis of Ultra-High Vacuum", (1968) pp. 234-239.
Granville-Phillips Company
Regan Maura K.
Strecker Gerard R.
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