Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Reexamination Certificate
2004-08-27
2008-10-07
Vanore, David A. (Department: 2881)
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
C250S304000, C378S044000, C378S045000, C378S046000, C378S047000, C378S049000, C378S050000
Reexamination Certificate
active
07432501
ABSTRACT:
An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises a charged particle impeding device located between the source and the detector. The charged particle impeding device is arranged to be maintained in a first configuration at a potential to impede the passage of charged particles and pass uncharged particles.
REFERENCES:
patent: 4484339 (1984-11-01), Mallozzi et al.
patent: 4558223 (1985-12-01), Broadhurst et al.
patent: 4652866 (1987-03-01), Siegmann et al.
patent: 4752685 (1988-06-01), Shiokawa et al.
patent: 4959848 (1990-09-01), Parobek
patent: 5038043 (1991-08-01), Dorion et al.
patent: 5166519 (1992-11-01), Turner
patent: 5249216 (1993-09-01), Ohsugi et al.
patent: 5365563 (1994-11-01), Kira et al.
patent: 6173037 (2001-01-01), Brouwer
patent: 6233307 (2001-05-01), Golenhofen
patent: 6314158 (2001-11-01), Shiota et al.
patent: 6448097 (2002-09-01), Singh et al.
patent: 6452401 (2002-09-01), Derbyshire et al.
patent: 6577704 (2003-06-01), Holz
patent: 6804595 (2004-10-01), Quail et al.
patent: 6917153 (2005-07-01), Oskam et al.
patent: 6934659 (2005-08-01), Polzin
patent: 6937691 (2005-08-01), Yamagami et al.
patent: 7206375 (2007-04-01), Chen et al.
patent: 7233643 (2007-06-01), Sipila et al.
patent: 7287322 (2007-10-01), Mathieu et al.
patent: 1 012 587 (2003-01-01), None
patent: 1 209 788 (1970-10-01), None
patent: 2001166059 (2001-06-01), None
patent: WO 9306470 (1993-04-01), None
patent: WO 98/36268 (1998-08-01), None
patent: WO 99/64891 (1999-12-01), None
R. A. Rosenberg, J. K. Simons, and S. P. Frigo, “X-ray fluorescence detection of low-Z elements using a microchannel plate detector,”Review of Scientific Instruments, vol. 63, No. 4, Part 1, Apr. 1992, p. 2193-2194, XP002305295, 1992, American Institute of Physics.
Masoud Kasrai et al, “X-ray fluorescence measurements of X-ray absorption near edge structure at the Si, P, and S L edges,”Journal of Vacuum Science&Technology A(Vacuum, Surfaces, and Films), vol. 11, No. 5, Sep.-Oct. 1993, p. 2694-2699, XP002305296, ISSN: 0734-2101, p. 2694, right-hand column, p. 2695, right-hand column, paragraph 2, American Vacuum Society, USA.
J. E. Bateman et al, “Studies of the Gain Properties of Microstrip Gas Counters Relevant to Their Application as X-Ray and Electron Detectors,”IEEE Transactions on Nuclear Science, vol. 49, No. 4, Aug. 2002, p. 1644-1650, XP002305297, p. 1649, 2002, IEEE Nuclear and Plasma Sciences Society.
G. Tourillon et al, “Electron yield X-ray absorption spectroscopy at atmospheric pressure,”Physics Letters A, vol. 121, No. 5, Apr. 27, 1987, p. 251-257, XP009039581, ISSN: 0375-9601, p. 251 and p. 255, Elsevier Science Publishers B.V., The Netherlands.
M. E. Kordesch and R. W. Hoffman, “Electron-yield extended X-ray absorption fine structure with the use of a gas-flow electron detector,”Physical Review B(Condensed Matter)USA, vol. 29, No. 1, Jan.-Jun. 1984, p. 491-492, XP002305299, ISSN: 0163-1829, entire document, The American Physical Society.
Bateman James Edmond
Derbyshire Gareth
Council for the Central Laboratory of the Research Councils
Michael & Best & Friedrich LLP
Vanore David A.
LandOfFree
Ionising particle analyser enabling for example the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ionising particle analyser enabling for example the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ionising particle analyser enabling for example the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3998198