Ion trap/time-of-flight mass spectrometer and method of...

Details Ion trap/time-of-flight mass spectrometer and method of... Ion trap/time-of-flight mass spectrometer and method of...

2007-01-09

2007-01-09

Berman, Jack (Department: 2881)

Radiant energy

Ionic separation or analysis

C250S282000, C250S287000, C250S252100, C250S292000

Reexamination Certificate

active

11128261

ABSTRACT:
An ion trap/time-of-flight mass spectrometer, which can perform accurate mass measurement of a product ion based on MS/MS and MSnhas an ion source for ionizing a sample, an ion trap capable of temporarily trapping ions, and a time-of-flight mass spectrometer. The ion source produces ions of the sample as a measurement target and ions of a reference sample each having a known mass value. A precursor ion is selected from among the ions of the measurement target sample, and the selected precursor ion is excited and fragmented in the ion trap to produce a product ion. The reference sample ions are introduced to and trapped in the ion trap. The trapped product ion and reference sample ions are expelled out of the ion trap and introduced to the time-of-flight mass spectrometer, thereby obtaining a mass spectrum.

REFERENCES:
patent: 5397894 (1995-03-01), Wells et al.
patent: 2004/0222369 (2004-11-01), Makarov et al.
patent: 11-154486 (1999-06-01), None
patent: 2001-28252 (2001-01-01), None
patent: 2001-74697 (2001-03-01), None
patent: 2003-123685 (2003-04-01), None
“Exact Mass Measurement of Product Ions for the Structural Elucidation of Drug Metabolites with a Tandem Quadrupole Orthogonal-Acceleration Time-of-Flight Mass Spectrometer” by Hopfgartner, et al. 1999 American Society for Mass Spectrometry. pp. 1305-1314.

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