Radiant energy – Ionic separation or analysis – Cyclically varying ion selecting field means
Reexamination Certificate
2011-08-02
2011-08-02
Berman, Jack I. (Department: 2881)
Radiant energy
Ionic separation or analysis
Cyclically varying ion selecting field means
C250S282000, C250S287000, C250S281000
Reexamination Certificate
active
07989764
ABSTRACT:
According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
REFERENCES:
patent: 4736101 (1988-04-01), Syka et al.
patent: 5479012 (1995-12-01), Wells
patent: 5572022 (1996-11-01), Schwartz et al.
patent: 5640011 (1997-06-01), Wells
patent: 5864136 (1999-01-01), Kelley et al.
patent: 6121610 (2000-09-01), Yoshinari et al.
patent: 6541766 (2003-04-01), Kato
patent: 6627876 (2003-09-01), Hager
patent: 6815673 (2004-11-01), Plomley et al.
patent: 7378653 (2008-05-01), Wells
patent: 7586089 (2009-09-01), Hartmer
patent: 2001/0002696 (2001-06-01), Kato
patent: 2002/0162958 (2002-11-01), Yoshinari et al.
patent: 2002/0185596 (2002-12-01), Amy et al.
patent: 2003/0085349 (2003-05-01), Kato
patent: 2003/0150988 (2003-08-01), Wells
patent: 2003/0150989 (2003-08-01), Yoshinari et al.
patent: 2003/0222211 (2003-12-01), Okumura et al.
patent: 2004/0149903 (2004-08-01), Wang
patent: 2004/0159785 (2004-08-01), Kato
patent: 2004/0211898 (2004-10-01), Yoshinari et al.
patent: 2005/0145790 (2005-07-01), Wang
patent: 2007/0158550 (2007-07-01), Wells
patent: 2007/0176098 (2007-08-01), Wells
patent: 62-37861 (1987-02-01), None
patent: 9-5298 (1997-01-01), None
patent: 2002-184348 (2002-06-01), None
patent: 2002-313276 (2002-10-01), None
patent: 2006-092750 (2006-04-01), None
patent: WO 94/28575 (1994-12-01), None
Japanese Office Action issued in Japanese Patent Application No. 2006-239070, dated Feb. 3, 2009.
Nagai Shinji
Nishida Tetsuya
Yasuda Hiroyuki
Berman Jack I.
Hitachi High-Technologies Corporation
McDermott Will & Emery LLP
Smith Johnnie L
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