Ion trap mass spectrometer with scanning delay ion extraction

Details Ion trap mass spectrometer with scanning delay ion extraction Ion trap mass spectrometer with scanning delay ion extraction

2007-04-24

2007-04-24

Wells, Nikita (Department: 2881)

Radiant energy

Ionic separation or analysis

C250S282000, C250S287000, C250S286000, C250S292000

Reexamination Certificate

active

10927874

ABSTRACT:
An apparatus for analyzing ions is described. The apparatus includes an ion source, an ion trap positioned to receive ions from the ion source; a time of flight mass analyzer, and a detector operatively coupled to the time of flight. The time of flight mass analyzer includes a pulser region, and the pulser region is positioned to receive ions from the ion trap. The apparatus further includes a scanning delay timing circuit in operable relation to the pulser region. The scanning delay timing circuit is adapted to triggering an extraction pulse at the pulser region. Methods of analyzing ions by mass spectrometry are also described.

REFERENCES:
patent: 6627883 (2003-09-01), Wang et al.
patent: 2001/0030284 (2001-10-01), Dresch et al.
patent: 2002/0030159 (2002-03-01), Chernushevich et al.
patent: 2003/0132377 (2003-07-01), Bateman et al.

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