Ion source for use in a mass spectrometer

Details Ion source for use in a mass spectrometer Ion source for use in a mass spectrometer

1987-12-21

1989-04-04

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, 250423R, B01D 5944

Patent

active

048188638

ABSTRACT:
An ion source for use in a mass spectrometer comprises a porous member arranged in the ionization chamber and bearing against the inlet tube so as to obstruct the open end of the inlet tube. A particle beam is directed to the effluent which exudes from the surface of the porous member after passing through the porous member. A cover shields a portion of the surface of the porous member from the particle beam so as only the most recently exuded effluent is irradiated. The effluent supplied into the porous member by the inlet tube is allowed to exude from surfaces of the porous member other than the surface bombarded with the particle beam so as to carry away stale effluents.

REFERENCES:
patent: 4267457 (1981-05-01), Nakagawa et al.
patent: 4562351 (1985-12-01), Atherton et al.
patent: 4708782 (1987-11-01), Andresen et al.
"Direct Coupling of Micro High-Performance Liquid Chromatography with Fast Atom Bombardment Mass Spectrometry", Journal of Chromatography, 346 (1985) 161-166.
Proceedings of the Seventh International Symposium on Capillary Chromatography, Gifu Grant Hotel, Nagara, Gifu, Japan, May 11-14, 1986, pp. 853-862.

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