Ion source for a mass spectrometer

Details Ion source for a mass spectrometer Ion source for a mass spectrometer

1991-12-12

1992-11-03

Berman, Jack I.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, 250423R, H01J 4904

Patent

active

051608413

ABSTRACT:
An ion source for a mass spectrometer has a continuous flow probe (FIG. 2) having a mesh defining a surface, a capillary for supplying liquid sample to the surface and a porous body disposed at the periphery of the mesh. An ion source generates a beam of ionising radiation to which sample supplied to the surface is exposed. Sample supplied by the inlet tube spreads across the surface and surplus sample reaching the periphery of the mesh is absorbed by the porous body.

REFERENCES:
patent: 4214159 (1980-07-01), Hillenkamp et al.
patent: 4296322 (1981-10-01), Wechsung
patent: 4562351 (1985-12-01), Atherton et al.
patent: 4794253 (1988-12-01), Kobayashi
patent: 4810878 (1989-07-01), Kobayashi
patent: 4818863 (1989-04-01), Kobayashi et al.
patent: 4820648 (1989-11-01), Caprioli et al.
patent: 4908512 (1990-03-01), Caprioli

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