Ion source assembly for an ion trap mass spectrometer and method

Details Ion source assembly for an ion trap mass spectrometer and method Ion source assembly for an ion trap mass spectrometer and method

1996-07-05

1998-05-26

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Cyclically varying ion selecting field means

250427, 250286, 250288, H01J 4914, H01J 4942

Patent

active

057569967

ABSTRACT:
An external ion source assembly in which ion are formed in an ion volume by the interaction of energetic electrons and gas molecules. The effective energy of the electrons entering the ion volume is controlled by changing the voltage between the electron source (filament) and the ionization volume whereby ions having sufficient energy for ionizing atoms and molecules leave the electron source and enter the ionization volume only during an ionization period. The ion source assembly can be used both for electron impact ionization (EI) and for chemical ionization (CI).

REFERENCES:
patent: 3355587 (1967-11-01), Jenckel
patent: 4540884 (1985-09-01), Stafford et al.
patent: 4736101 (1988-04-01), Syka et al.
patent: 5015848 (1991-05-01), Bomse et al.

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