Radiant energy – Ionic separation or analysis – With sample supply means
Patent
1999-06-09
2000-11-14
Warden, Jill
Radiant energy
Ionic separation or analysis
With sample supply means
250282, 204452, 204603, B01D 5944, H01J 4900, G01N 2726
Patent
active
061473472
ABSTRACT:
A mass spectrometer includes a sample passage through which a sample solution flows towards a tip of the sample passage, a gas passage which produces a gas flow along the sample passage towards an orifice of the gas passage, a gas supplier which supplies a gas to the gas passage so that the gas flow has a velocity effective for spraying the sample solution near the tip of the sample passage, and an analyzer which analyzes a mass of gaseous ions formed from the sample solution sprayed by the gas flow. The gas flow has a characteristic value F/S between 350 meters/second (m/s) and 700 m/s, where F is a flow rate of the gas at standard conditions (20.degree. C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of the sample passage at the orifice. An exposed length of the sample passage between an external opening of the orifice and the tip of the sample passage may be between -0.25 mm and 1.2 mm.
REFERENCES:
patent: 4298795 (1981-11-01), Takeuchi et al.
patent: 4300044 (1981-11-01), Iribarne et al.
patent: 4861988 (1989-08-01), Henion et al.
patent: 4935624 (1990-06-01), Henion et al.
patent: 4977785 (1990-12-01), Willoughby et al.
patent: 5122670 (1992-06-01), Mylchreest et al.
patent: 5130538 (1992-07-01), Fenn et al.
patent: 5170052 (1992-12-01), Kato
patent: 5170053 (1992-12-01), Hail et al.
patent: 5223226 (1993-06-01), Wittmer et al.
patent: 5306412 (1994-04-01), Whitehouse et al.
patent: 5306910 (1994-04-01), Jarrell et al.
patent: 5349186 (1994-09-01), Ikonomou et al.
patent: 5376789 (1994-12-01), Stenhagen
patent: 5423964 (1995-06-01), Smith et al.
patent: 5559326 (1996-09-01), Goodley et al.
patent: 5898175 (1999-04-01), Hirabayashi et al.
M. Ikonomou et al., "Electrospray--Ion Spray: A Comparison of Mechanisms and Performance", Analytical Chemistry, vol. 63, No. 18, Sep. 15, 1991, pp. 1989-1998.
B. Thomson et al., "Field induced ion evaporation from liquid surfaces at atmospheric pressure", Journal of Chemical Physics, vol. 71, No. 11, Dec. 1, 1979, pp. 4451-4463.
H. Kambara, "Sample Introduction System for Atmospheric Pressure Ionization Mass Spectrometry of Nonvolatile Compounds", Analytical Chemistry, vol. 54, No. 1, Jan. 1982, pp. 143-146.
M. Yamashita et al., "Electrospray Ion Source. Another Variation on the Free-Jet Theme", Journal of Physical Chemistry, vol. 88, No. 20, 1984, pp. 4451-4459.
A. Bruins et al., "Ion Spray Interface for Combined Liquid Chromatography/Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 59, No. 22, Nov. 15, 1987, pp. 2642-2646.
A. Cappiello et al., "Micro Flow Rate Particle Beam Interface for Capillary Liquid Chromatography/Mass Spectrometry", Analytical Chemistry, vol. 65, No. 9, May 1, 1993, pp. 1281-1287.
P. Kebarle et al., "From Ions in Solution to Ions in the Gas Phase--The Mechanism of Electrospray Mass Spectrometry", Analytical Chemistry, vol. 65, No. 22, Nov. 15, 1993, pp. 972 A-974 A.
A. Bruins, "Atmospheric-pressure-ionization mass spectrometry--II. Applications in pharmacy, biochemistry and general chemistry", Trends in Analytical Chemistry, vol. 13, No. 2, 1994, pp. 81-90.
M. Wilm et al., "Electrospray and Taylor-Cone theory, Dole's beam of macromolecules at last?", International Journal of Mass Spectrometry and Ion Processes, vol. 136, Nos. 2/3, Sep. 22, 1994, pp. 167-180.
A. Hirabayashi et al., "Sonic Spray Ionization Method for Atmospheric Pressure Ionization Mass Spectrometry", Analytical Chemistry, vol. 66, No. 24, Dec. 15, 1994, pp. 4557-4559.
U.S. Pat. application Ser. No. 09/299,638 filed on Apr. 27, 1999.
Hirabayashi Atsumu
Koizumi Hideaki
Sakairi Minoru
Takada Yasuaki
Umemura Kaoru
Hitachi , Ltd.
Starsiak Jr. John S.
Warden Jill
LandOfFree
Ion source and mass spectrometer instrument using the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ion source and mass spectrometer instrument using the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion source and mass spectrometer instrument using the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2067346