Ion mass spectrometer

Details Ion mass spectrometer Ion mass spectrometer

1982-03-24

1984-03-06

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

B01D 5948, H01J 4926

Patent

active

044356420

ABSTRACT:
An ion mass spectrometer is described which detects and indicates the characteristics of ions received over a wide angle, and which indicates the mass to charge ratio, the energy, and the direction of each detected ion. The spectrometer includes a magnetic analyzer (18) having a sector magnet (24) that passes ions received over a wide angle, and an electrostatic analyzer (30) positioned to receive ions passing through the magnetic analyzer. The electrostatic analyzer includes a two dimensional ion sensor (32) at one wall of the analyzer chamber, that senses not only the lengthwise position of the detected ion to indicate its mass to charge ratio, but that also detects the ion position along the width of the chamber to indicate the direction in which the ion was travelling.

REFERENCES:
patent: 3986024 (1976-10-01), Radermacher
patent: 4171482 (1979-10-01), Vastel
patent: 4307295 (1981-12-01), Barber et al.

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