Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2007-02-06
2010-06-08
Berman, Jack I (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S492220, C250S492100, C250S492200
Reexamination Certificate
active
07732790
ABSTRACT:
An ion implanting apparatus is provided, which prevents a failure of the processing object caused by a scattering of the deposited particles of the ion species on an inner surface of a through hole of a member that forms a beam geometry of an ion beam. Since at least an inner surface of the through hole222of the member220having a through hole and being capable of forming a beam geometry is coated with a thermal spraying film, unwanted deposition of the ion species on the inner surface of the through hole222is inhibited. Moreover, since a deposition film generated on the surface of the thermal spraying film has an unoriented poly-crystalline structure that exhibits extremely higher inter-layer adhesiveness, a failure of the processing object caused by a scattering of the particles peeled-off from the deposition layer is prevented.
REFERENCES:
patent: 5102498 (1992-04-01), Itoh et al.
patent: 5947053 (1999-09-01), Burnham et al.
patent: 6544597 (2003-04-01), Takahashi et al.
patent: 7276287 (2007-10-01), Smith et al.
patent: 2003/0066975 (2003-04-01), Okada
patent: 2004/0092396 (2004-05-01), Glazer et al.
patent: 2005/0276928 (2005-12-01), Okumura et al.
patent: 2006/0022144 (2006-02-01), Cha
patent: 2006/0288934 (2006-12-01), Takahashi et al.
patent: 1329180 (2002-01-01), None
patent: 3-269940 (1991-12-01), None
patent: 10-25178 (1998-01-01), None
patent: 11-149898 (1999-06-01), None
patent: 11-283552 (1999-10-01), None
patent: 2002-004027 (2002-01-01), None
Chinese Office Action dated Dec. 25, 2009 with English translation.
Ikeda Minoru
Matsufune Satoshi
Takada Jitsuo
Berman Jack I
Ippolito Rausch Nicole
McGinn Intellectual Property Law Group PLLC
NEC Electronics Corporation
LandOfFree
Ion implanting apparatus for forming ion beam geometry does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ion implanting apparatus for forming ion beam geometry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion implanting apparatus for forming ion beam geometry will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4248955