Ion implanter, internal structure of ion implanter and...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

08080813

ABSTRACT:
An ion implanter includes a process chamber and a coating layer. The process chamber receives a substrate and provides a space to perform an ion implantation process on the substrate. The coating layer is disposed on an inner wall of the process chamber to reduce contamination of the substrate and includes the same material as that of the substrate.

REFERENCES:
patent: 4003770 (1977-01-01), Janowiecki et al.
patent: 6120660 (2000-09-01), Chu et al.
patent: 7824498 (2010-11-01), Parkhe et al.
patent: 2005/0260354 (2005-11-01), Singh et al.
patent: 1977351 (2007-06-01), None
patent: 05-326471 (1993-12-01), None
patent: 2001-007041 (2001-01-01), None
patent: 2002-343735 (2002-11-01), None
patent: WO 2005/114692 (2005-12-01), None
Letter dated Mar. 10, 2011 with Notice of first Office Action dated Feb. 11, 2011 for Chinese Application No. 200580020329, filed Jul. 3, 2008, 7 pages.
International Search Report PCT/KR2008/003930 dated Dec. 31, 2008, 3 pages.
Written Opinion of the International Searching Authority PCT/KR2008/003930 dated Dec. 31, 2008, 4 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Ion implanter, internal structure of ion implanter and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ion implanter, internal structure of ion implanter and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion implanter, internal structure of ion implanter and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4303837

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.