Ion implantation method

Fishing – trapping – and vermin destroying

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437 30, 437248, H01L 21265

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active

052388581

ABSTRACT:
An ion implantation method for forming a high concentration dopant implanted layer in a semiconductor substrate comprising irradiating an ion beam of a desired dopant in the semiconductor substrate and annealing the resultant, in which the irradiation of the ion beam is conducted with stepwise reduction of an acceleration energy for the ion beam, intercepting at least for a period during its reduction being proceeded, whereby affording the high concentration dopant implanted layer distributed as a substantially contiguous amorphous layer, and an ion implantation apparatus comprising an ion source, ion attracting means for attracting ions from the ion source, ion selecting means for selecting specified ions among the ions attracted by the ion attracting means, accelerating means for accelerating a beam of the specified ions selected by the ion selecting means with an acceleration energy stepwise reduced, beam scanning means for scanning a direction of the ion beam accelerated by the accelerating means, a sample cell having an opening through which the ion beam scanned by the beam scanning means is introduced thereto, intercepting means for intercepting the ion beam introduced to the sample cell and control means for controlling the accelerating means and the intercepting means in operation.

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patent: 4845045 (1989-07-01), Shacham et al.
patent: 4975385 (1990-12-01), Beinglass et al.
Hammer, W. "Cooling Ion Implantation Target", IBM Technical Disclosure Bulletin vol. 19, No. 6, Nov. 1976 pp. 2270-2271.
Mayer, J., et al., Ion Implantation In Semiconductors: Silicon and Germanium, New York, 1970, pp. 108-112.

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