Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2007-06-05
2007-06-05
Vanore, David (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S397000
Reexamination Certificate
active
10950633
ABSTRACT:
An ion implantation apparatus includes an ion irradiation unit. The ion irradiation unit irradiates a plurality of areas of a target substrate with ion beams each of which reaches the substrate at corresponding one incident angle. An incident angle measuring instrument measures the incident angle of each of the ion beams. A controller is provided with information from the incident angle measuring instrument and controls the ion irradiation unit in accordance with the information so that a difference among incident angles is set to within ±0.1°.
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Copy of Notification of Reasons for Rejection from Japanese Patent Office mailed Feb. 6, 2007, in Japanese Application No. 2004-097065.
Hashimoto Hiroshi
Hirakawa Tadahiko
Shibata Takeshi
Tonari Kazuhiko
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Johnston Phillip A.
Kabushiki Kaisha Toshiba
Sanyo Electric Co,. Ltd.
Sony Corporation
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