Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...
Reexamination Certificate
2011-05-10
2011-05-10
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
C438S141000, C438S189000, C438S318000, C438S331000, C438S350000, C257SE21350, C257SE21352, C257SE21361
Reexamination Certificate
active
07939414
ABSTRACT:
Methods for forming a bipolar junction transistor device are described herein. A method for forming the bipolar junction transistor device may include doping a first portion of a substrate with a first dopant to form a base pick-up region, and after doping the first portion of the substrate, doping a second portion of the substrate with a second dopant to form at least one emitter region. A bipolar junction transistor device may include a floating collector, in which case the bipolar junction transistor device may be operated as a diode for improved emitter current.
REFERENCES:
patent: 6797587 (2004-09-01), Yang et al.
patent: 6969901 (2005-11-01), Pan et al.
patent: 7087488 (2006-08-01), Wu
patent: 7618871 (2009-11-01), Meinhardt et al.
patent: 2004/0227213 (2004-11-01), Chen
patent: 2006/0022278 (2006-02-01), Pan et al.
patent: 2007/0278515 (2007-12-01), Hurst
patent: 2007/0278612 (2007-12-01), Williams et al.
Chang Runzi
Lee Peter
Lee Winston
Sutardja Pantas
Wei Chien-Chuan
Ahmadi Mohsen
Garber Charles D
Marvell International Ltd.
LandOfFree
Ion implantation and process sequence to form smaller base... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ion implantation and process sequence to form smaller base..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion implantation and process sequence to form smaller base... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2648725