Ion detection using a pillar chip

Details Ion detection using a pillar chip Ion detection using a pillar chip

2008-04-08

2010-11-16

Vanore, David A (Department: 2881)

Radiant energy

Ionic separation or analysis

Methods

C250S281000, C250S282000, C250S288000, C436S043000, C436S048000, C436S094000, C204S601000, C204S604000

Reexamination Certificate

active

07834314

ABSTRACT:
Methods and assemblies for ion detection in samples using a chip with elevated sample zones, also known as a “pillar chip.” Methods include analyzing such a sample by desorbing a sample from a chip, producing a described ion sample and detecting the same. The chip comprises a base having a surface and one or more structures protruding above the surface of the base. Each structure comprises a pillar and a sample zone, the latter containing a support material and the sample to be analyzed. Assemblies include a chip such as that described above and a conductive element that comprises an aperture of sufficient proportion to allow passage of a molecular ion and that is adapted to be at a different electrical potential than the base of the chip.

REFERENCES:
patent: 6175112 (2001-01-01), Karger et al.
patent: 6399177 (2002-06-01), Fonash et al.
patent: 6454924 (2002-09-01), Jedrzejewski et al.
patent: 6699719 (2004-03-01), Yamazaki et al.
patent: 6794196 (2004-09-01), Fonash et al.

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