Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-05-16
2006-05-16
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C702S107000
Reexamination Certificate
active
07047144
ABSTRACT:
In a method for optimizing an ion detector a control voltage, such as in a mass spectrometry system, an array of mass scan data is acquired. Based on the size of the largest peak in the array or part of the array, a determination is made as to whether the current detector gain should be changed to a new detector gain. If the current detector gain should be changed, the control voltage for the subsequent mass scan is adjusted to a new control voltage corresponding to the new detector gain. The data are scaled based on the current detector gain. In another method, a gain versus control voltage curve is generated for calibration. These methods may be implemented by hardware, software, analog or digital circuitry, and/or computer-readable or signal-bearing media.
REFERENCES:
patent: 3946229 (1976-03-01), Moseman et al.
patent: 6576897 (2003-06-01), Steiner et al.
patent: 2004/0084613 (2004-05-01), Bateman et al.
Bui Bryan
Fishman Bella
Varian Inc.
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