Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Semiconductors for nonelectrical property
Patent
1984-12-04
1987-02-03
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Semiconductors for nonelectrical property
324439, 204406, G01N 2702, G01N 2726
Patent
active
046410848
ABSTRACT:
An apparatus for measuring a concentration of a specific ion contained in a test liquid held in a container with the aid of a reference electrode and an ion sensitive field effect transistor having a gate portion selectively sensitive to the specific ion, including a series circuit of a reference resistor and a constant voltage supply source connected across drain and source of the ion sensitive field effect transistor, a potential control circuit having inputs connected across the reference resistor to detect a potential difference across the reference resistor for controlling a source or drain potential of the ion sensitive field effect transistor in such a manner that the potential difference remains at a predetermined value and a voltmeter for measuring the source or drain potential as a measure of the ion concentration.
REFERENCES:
patent: 3648159 (1972-03-01), Stansell et al.
patent: 4332658 (1982-06-01), Tsuboshima
patent: 4385274 (1983-05-01), Shimada et al.
patent: 4444644 (1984-04-01), Hiramoto et al.
patent: 4490216 (1984-12-01), McDonnell
Eisenzopf Reinhard J.
Mueller Robert W.
Olympus Optical Co,. Ltd.
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