Ion beam implantation method and apparatus for particulate contr

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

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250398, H01J 37317

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active

051342995

ABSTRACT:
An ion beam implanter having a remote ion beam collector to reduce particulate contamination in the region of the implant chamber. A resolving magnet is activated during implantation to bend ions that exit a source to a trajectory leading to an ion implantation chamber. By de-activating the resolving magnet when not implanting, ions from the source follow a linear path to the ion beam collector.

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