Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2002-01-23
2003-05-20
Lee, John R. (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S306000, C250S307000, C250S42300F, C250S297000, C073S105000, C073S104000, C356S370000
Reexamination Certificate
active
06566653
ABSTRACT:
BACKGROUND OF INVENTION
1. Field of the Invention
The invention relates to an investigation device and an investigation method. More particularly, it relates to a device for picking of particles from a sample and analyzing them with a mass-spectrometer.
2. Background of the Invention
Japanese disclosure, JP 061 95155, discloses a region surface analyzing method and device. A surface atom of a specimen is stuck to the tip of a probe. A specimen holder is removed from a scanning tunneling microscope and placed outside the time of flight of an ion. When a switch is switched, output voltages of a straight polarity from a high voltage power source and a straight polarity from a pulse generator are adjusted to generate a pulse. The pulse generated is picked up by a logos key coil and a clock of a mass spectrometry system using a time of flight method is started. When the ion is separated, the clock is stopped by a signal sent from an ion detector and the time difference between the stop signal and the start signal, the time of flight, is recorded. An element is identified based on the time of flight.
In an article entitled, “Atomic species identification in scanning tunneling microscopy by time of flight spectroscopy” by Spence, Weierstall, and Lo, Journal of Vacuum Science Technology, B 14(3), May/June 1996, pp. 1587-1590, it is described how atoms at particular sites can be selected from an STM or AFM image for identification. Atoms from a sample are picked up with a tip, the sample is the being removed and a much larger voltage pulse is applied causing field evaporation of these atoms into a time of flight mass spectrometer.
SUMMARY OF INVENTION
The invention is directed to an investigation device comprising a time of flight mass spectrometer with an entrance opening, and an electrically conductive tip which is movable from a first position near a sample on a sample holder to in a second position near the entrance opening. The tip is located at a cantilever. In the case where a sample is located on the sample holder, a sample particle can be obtained when the tip is in the first position located next to the sample. The tip, having obtained the particle, is movable into the second position where the particle can be accelerated towards the entrance opening. The particle is then analyzable in the time of flight mass spectrometer.
REFERENCES:
patent: 5621211 (1997-04-01), Spence
patent: 5742377 (1998-04-01), Minne et al.
patent: 6-195155 (1994-07-01), None
Weierstall, U., and Spence, J.C.H., “Atomic Species Identification.”, Surface Science 398 (1998) 267-279.*
J.C.H. Spence and U. Weierstall.Department of Physics and Astronomy, Arizona State University, Tempe, Arizona:W. Lo.Department of Applied and Engineering Physics, Cornell University, Ithica, New York; “Atomic Species Identification In Scanning Tunneling Microscopy By Time-Of-Flight Spectroscopy”; J. Vac. Sci. Techno. B 14(3). May/Jun. 1996 American Vacuum Society pp. 1587-1590.
Bennewitz Roland
Despont Michel
Gerber Christoph
Meyer Ernst
Vettiger Peter
Hashmi Zia R.
Jennings Derek S.
Lee John R.
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