Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1997-02-14
1998-11-03
Larkin, Daniel S.
Measuring and testing
Surface and cutting edge testing
Roughness
G01B 528
Patent
active
058311530
ABSTRACT:
An investigation and/or manipulation device for a sample which is located in a container fluid includes an investigation and/or manipulation tool which is mounted at a first of a cantilever and which during investigation and/or manipulation of the sample immerses into the container fluid. The opposite side of the cantilever is at least partly not immersed into the container fluid during investigation.
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patent: 5463897 (1995-11-01), Prater et al.
Baselt et al., "Scanned-Cantilever Atomic Force Microscope", Rev. Sci. Instrum., vol. 64, No. 4, Apr. 1993, pp. 908-911.
Drake et al., "Imaging Crystal, Polymers, and Processess in Water with the Atomic Force Microscope", Science, vol. 243, 24 Mar. 1989, pp. 1586-1589.
Maivald et al., "Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope", Nanotechnology, vol. 02, 1991, pp. 103-106.
Binnig Gerd Karl
Haeberle Walter
August Casey P.
International Business Machines - Corporation
Larkin Daniel S.
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