Inversion layer sprain gauge

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system

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Details

357 26, G01B 716

Patent

active

041910575

ABSTRACT:
A strain gauge element having an elastic beam with field effect transistors deposited on one surface arranged in a Wheatstone bridge so that deformation of the beam produces a proportional imbalance signal across the bridge, and means for applying a gate biasing voltage to the transistors with at least one such voltage being adjustable so that the bridge can be electrically balanced for a null or no load condition.

REFERENCES:
patent: 3121337 (1964-02-01), Hollander
patent: 3761784 (1973-09-01), Jund
patent: 4005318 (1977-01-01), Claiborne

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