Cryptography – Particular algorithmic function encoding
Reexamination Certificate
2011-08-23
2011-08-23
Orgad, Edan (Department: 2439)
Cryptography
Particular algorithmic function encoding
C380S029000, C380S030000, C380S036000, C380S037000, C380S042000, C380S255000, C380S259000, C380S260000
Reexamination Certificate
active
08005209
ABSTRACT:
Advanced Encryption Standard (AES) is an encryption algorithm for securing sensitive unclassified material by U.S. Government agencies and, as a consequence the de facto encryption standard for commercial applications worldwide. Performing concurrent error detection (CED) for protection of such a widely deployed algorithm is an issue of paramount importance. We present a low-cost CED method for AES. In this method, we make use of invariance properties of AES to detect errors. For the first time, the invariance properties of the AES, which are for the most part used to attack the algorithm, are being used to protect it from fault attacks. Our preliminary ASIC synthesis of this architecture resulted in an area overhead of 13.8% and a throughput degradation of 16.67%.
REFERENCES:
patent: 2002/0051534 (2002-05-01), Matchett et al.
Breveglieri et al (“Detecting Faults in Four Symmetric Key Block Ciphers”, 15th IEEE International Conference on Application-Specific Systems, Architectures and Processors (ASAP'04) ).
Bertoni et al (“A Parity Code Based Fault Detection for an Implementation of the Award Encryption Standard”, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI (DFT'02).
Ozev et al., “Cost Effective Concurrent Test Hardware Design for Linear Analog Circuits,” ICCD, 2002, 258-264.
Metra et al., “On-Line Testing of Transient Faults Affecting Functional Blocks of FCMOS, Domino and FPGA-Implemented Self-Checking Circuits,” DFT, 2002, 207-215.
Boneh et al., “On the importance of checking cryptographic protocols for faults,” Proceedings of Eurocrypt, Lecture Notes in Computer Science vol. 1233, 1997, 37-51.
Biham et al., “Differential Fault Analysis of Secret Key Cryptosystems,” Proceedings of Crypto, 1997.
Bloemer et al., “Fault Based cryptanalysis of the Advanced Encrytpion Standard,” www.iacr.org/enrint/2002/075.pdf.
Giraud, “Differntial Fault Analysis on AES,” eprint.iacr.org/2003/008.ps.
Piret et al., “A Differential Fault Attack Technique against SPN structures, with Application to the AES and KHAZAD,” CHES, 2003, Springer Verlag LNCS 2779.
Daemen et al., “AES proposal: Rijndael,” Advanced Enryption Standard (AES), csrc.nist.gov/CryptoTooklit/aes/rijndael/, 2001.
Karri et al., “Concurrent Error Detection of Fault Based Side-Channel Cryptanalysis of 128-Bit Symmetric Block Ciphers,” IEEE Transactions on CAD, 2002.
Bertoni et al., “Error Analysis and Detection Procedures for a Hardware Implementation of the Advanced Encryption Standard,” IEEE Transactions on Computers, 52(4), 492-505, Apr. 20.
Bertoni et al., “On the propagation of faults and their detection in a hardware implementation of the advanced encryption standard,” Proceedings of ASAP'02, 2002, 303-312.
Makris et al., “Invariance-Based On-Line Test for RTL Controller-Datapath Circuits,” VTS, 2000.
Desmedt et al., “Cyclic Properties of AES round Functions,” Invited Talk, 4th Conference on the AES, 2004.
Tri Van Le, “Novel Cyclic Properties of AES,” http://eprint.iacr.org/2003/108/.
Karri et al., “Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers,” CHES, 2003, Springer Verlang LNCS 2779.
Joshi Nikhil
Karri Ramesh
Kabir Jahangir
Orgad Edan
Polytechnic University
Woodcock & Washburn LLP
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