Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1993-05-18
1995-02-07
Sikes, William L.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351211, 351221, A61B 310
Patent
active
053879511
ABSTRACT:
An intraocular length measuring instrument according to the invention can avoid errors in measurement caused by the movement of a subject's eye, such as a blink or involuntary eye movement, and improve the accuracy of the measurement of an intraocular length of the eye. The intraocular length measuring instrument includes a pattern image projecting and receiving optical system for projecting a pattern image onto the cornea of the eye and receiving the pattern image into a two-dimensional image sensor; an interferometric system for producing interference light in such a way that measuring light is projected onto a surface of an intraocular object to be measured while reference light is projected onto a reference surface corresponding to the object surface and interference is caused between light reflected by the object surface and light reflected by the reference surface and causing a photosensor to receive the interference light and output an interference signal; a device for determining the position of the object surface by sampling interference signals output by the photosensor; a device for reading the data concerning the pattern image received by the two-dimensional image sensor at any point of time of the duration of the sampling in order to memorize the pattern image data in a memory medium; and means for determining the position of a corneal vertex from the pattern image data memorized in the memory medium.
REFERENCES:
patent: 4796989 (1989-01-01), Fukuma et al.
patent: 5141302 (1992-08-01), Arai et al.
Kabushiki Kaisha Topcon
Mai Huy
Sikes William L.
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