Interpretation system for interpreting reflectometry...

Details Interpretation system for interpreting reflectometry... Interpretation system for interpreting reflectometry...

2007-10-16

2007-10-16

Nguyen, Tu T. (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

10625629

ABSTRACT:
Interpretation systems for interpreting reflectometry information are provided with modules for making interpretations, with each module comprising a generating module-part, a testing module-part, and a debugging module-part, and with one module being a generating system-part for a next module and with said next module being a testing system-part and a debugging system-part for said one module, to introduce improved intelligence. These interpretation systems have double-level Generate-Test-Debug (GTD) structures, two at module level as well as one at system level. This improved intelligence can be further improved by introducing a third module resulting in three GTD structures at module level and two GTD structures at system level. Interpretations are pulse-based, energy-based, simulation-based for rough, medium, and precise interpretation for increasing the efficiency of the improved intelligence.

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patent: 0391312 (1990-10-01), None
patent: WO 01/01158 (2001-01-01), None

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