Interposer probe and method for testing

Details Interposer probe and method for testing Interposer probe and method for testing

2006-06-20

2006-06-20

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

07064567

ABSTRACT:
An interposer probe includes a main board having a first side and a second side. A lower riser board mounted to the first side of the main board and in electrical contact therewith is configured to engage an integrated circuit socket on a device to be tested. An upper riser board mounted to the second side of said main board and in electrical contact therewith, is configured to receive an integrated circuit package. A retention frame mounted to the first side of said main board engages the integrated circuit socket on the device to be tested.

REFERENCES:
patent: 4853626 (1989-08-01), Resler
patent: 4912401 (1990-03-01), Nady et al.
patent: 4997377 (1991-03-01), Goto et al.
patent: 5859538 (1999-01-01), Self
patent: 5896037 (1999-04-01), Kudla et al.
patent: 6144559 (2000-11-01), Johnson et al.

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