Interpolator testing circuit

Details Interpolator testing circuit Interpolator testing circuit

2007-07-17

2007-07-17

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S069000, C702S125000

Reexamination Certificate

active

10852540

ABSTRACT:
An interpolator testing system and method comprises an interpolator that includes a phase shift module. The phase shift module receives a reference clock signal and generates M clock signals having phase shifts in increments of 360/M degrees relative to the reference clock signal. A phase select module receives the reference clock signal and a recovered clock signal during a normal mode and generates a select signal based on a comparison of the reference clock signal and the recovered clock signal during the normal mode. A selector receives the M clock signals and outputs one of the M clock signals as the recovered clock signal based on the select signal. A recovered clock counter counts an attribute of the recovered clock signal during a test mode. The phase select module sequentially selects the M clock signals N times during the test mode.

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