Internally damped, self-arresting vertical drop-weight impact te

Details Internally damped, self-arresting vertical drop-weight impact te Internally damped, self-arresting vertical drop-weight impact te

1994-05-20

1995-10-17

Chilcot, Richard

Measuring and testing

Testing by impact or shock

Specimen impactor detail

73 1213, G01N 300

Patent

active

054579848

ABSTRACT:
A vertical dropped-weight impact test machine has a dropped-weight barrel vertically supported on upper and lower support brackets. The dropped-weight barrel is chambered to receive a dropped-weight assembly having a latch pin at its upper end, a damping unit in the middle, and a tup at its lower end. The tup is adapted for gathering data during impact testing. The latch pin releasably engages a latch pin coupling assembly. The latch pin coupling assembly is attached to a winch via a halyard for raising and lowering the dropped-weight assembly. The lower end of the dropped-weight barrel is provided with a bounce-back arresting mechanism which is activated by the descending passage of the dropped-weight assembly. After striking the specimen, the dropped-weight assembly rebounds vertically and is caught by the bounce-back arresting mechanism. The damping unit of the dropped-weight assembly serves to dissipate energy from the rebounding dropped-weight assembly and prevents the dropped-weight assembly from rebounding from the self-arresting mechanism.

REFERENCES:
patent: 3453862 (1969-07-01), Elliott et al.
patent: 4313337 (1982-02-01), Myint
patent: 4649735 (1987-03-01), Pihaja

Affiliated with

Also associated with

Rating

Internally damped, self-arresting vertical drop-weight impact te does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Internally damped, self-arresting vertical drop-weight impact te, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Internally damped, self-arresting vertical drop-weight impact te will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-589259