Internal test circuitry for integrated circuits using token pass

Details Internal test circuitry for integrated circuits using token pass Internal test circuitry for integrated circuits using token pass

1990-03-02

1992-05-19

Atkinson, Charles E.

Excavating

371 221, G01R 3128

Patent

active

051154374

ABSTRACT:
Built-in test circuitry, which is appropriate for monolithic integrated circuit chips that are to be connected in a plural-chip package, uses electronic token passing to select one of the test input ports in the circuitry to be tested for application of test input vectors. The built-in test circuitry also uses electronic token passing to select one of the test output ports in the circuitry to be tested from which test results are to be supplied.

REFERENCES:
patent: 4495622 (1985-01-01), Charruau
patent: 4724380 (1988-02-01), Burrows et al.
patent: 4764926 (1988-08-01), Knight et al.
patent: 4837765 (1989-06-01), Suzuki
patent: 4989209 (1991-01-01), Littlebury et al.

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