Internal reflection nanosampling spectroscopy

Details Internal reflection nanosampling spectroscopy Internal reflection nanosampling spectroscopy

1986-07-25

1988-03-22

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

356244, G01N 2101

Patent

active

047324759

ABSTRACT:
A novel internal reflection element and associated optics for examining micro- or nano-gram quantities of a sample material by internal reflection spectroscopy, wherein the element is sized for ease of handling, and is configured to allow entrance of a radiation beam at one end, to guide the radiation to the opposite end, to concentrate the guided radiation at a small triangular-shaped sampling surface, from which the beam is directed out of the element. Adjustable masking means is also provided to reduce the unmodulated content or undesired portions of the exiting beam.

REFERENCES:
patent: 3415602 (1968-12-01), Harrick
patent: 3540025 (1970-11-01), Levin et al.
Harrick, "Internal Reflection Spectroscopy", Interscience Publishers, 1967, pp. 124-125.

Affiliated with

Also associated with

Rating

Internal reflection nanosampling spectroscopy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Internal reflection nanosampling spectroscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Internal reflection nanosampling spectroscopy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-439138