Internal bias measure with onboard ADC for electronic devices

Details Internal bias measure with onboard ADC for electronic devices Internal bias measure with onboard ADC for electronic devices

2007-03-06

2007-03-06

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S130000

Reexamination Certificate

active

11052847

ABSTRACT:
An apparatus and method for on-chip bias measurement of an analog signals on an integrated circuit with a switchable analog-to-digital converter capable of performing testing and other types of processing. Analog signal test locations are selected for testing by a test input selector which is in turn controlled by a controller on an integrated circuit, such as an imager chip. Test locations are connected to one or more analog-to-digital converters through the test input selector. The analog-to-digital converter(s) output a test measurement digital output to either test equipment or an on-chip calibration circuit. Test equipment or on-chip calibration circuits adjusts imager component bias or other operating parameters used in chip or device operation based on output from the analog-to-digital converter(s).

REFERENCES:
patent: 5563526 (1996-10-01), Hastings et al.
patent: 5757425 (1998-05-01), Barton et al.
patent: 5818500 (1998-10-01), Edwards et al.
patent: 5953681 (1999-09-01), Cantatore et al.
patent: 6091492 (2000-07-01), Strickland et al.
patent: 6285349 (2001-09-01), Smith
patent: 6288801 (2001-09-01), Leberl et al.
patent: 6449396 (2002-09-01), Loce et al.
patent: 6683702 (2004-01-01), Loce et al.
patent: 6799133 (2004-09-01), McIntosh et al.
Brandt, Brain P and Lutsky, Joseph,A 75-mW, 10-b, 20-MSPS CMOS Subranging ADC with 9.5 Effective Bits at Nyquist, IEEE Journal of Solid-State Circuits, vol. 34, No. 12, Dec. 1999, pp. 1788-1795.
Moon, Un-Ku and Song, Bang-Sup,Background Digital Calibration Techniques for Pipelined ADC's, pp. 1-29.
McCaffrey, Nathanial,CMOS Active Pixel Sensors with Extended Dynamic Range For High-Performance Machine Vision, Vision Show 2000 Sarnoff Corporation, Mar. 17, 2000.
Understanding Data Converters Application Report, Texas Instruments, Mixed-Signal Products SLAA013, 1995, pp. i-iv and 1-17.
Kugelstadt, TomSwitched-Capacitor ADC Analog Input Calculations Application Report, Texas Instruments, Digital Signal Processing Solutions SLAA036, Sep. 1998, pp. i-iv.
Austin, John,Getting the Full Potential From Your ADC, Application Report, Burr-Brown Products from Texas Instruments, SBAA069A, Mar. 2001, Revised Sep. 2002, pp. 1-4.
TLC1225I, TLC1225M Self-Calibrating 12-Bit-Plus-Sign Analog-to-Digital Converters, Texas Instruments, SLAS029B, Aug. 1990, Revised Dec. 1993, pp. 1-14.

Affiliated with

Also associated with

Rating

Internal bias measure with onboard ADC for electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Internal bias measure with onboard ADC for electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Internal bias measure with onboard ADC for electronic devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3771006