Interlace overlap pixel design for high sensitivity CMOS...

Details Interlace overlap pixel design for high sensitivity CMOS... Interlace overlap pixel design for high sensitivity CMOS...

2005-03-15

2005-03-15

Moe, Aung (Department: 2612)

Television

Camera, system and detail

Solid-state image sensor

C348S302000

Reexamination Certificate

active

06867806

ABSTRACT:
In a CMOS-type image sensor, a plurality of pairs of light-detecting elements (LDEs) are arranged in rows and columns to generate analog signals proportional to the intensity of light impinging on respective one of the LDEs. First and second photo sensing means in each pair of LDEs are coupled in parallel, in the column direction, at a floating sensing point through first turn-on means. The first and second photo sensing means in adjacent pairs of LDEs are coupled in parallel in the column direction through second turn-on means. The first turn-on means are enabled by first control lines and the second turn-on means are enabled by second control lines coupled thereto, respectively. Analog signals acquired in the first and second photo sensing means of one pair or of adjacent pairs are present at the floating sensing point in response to the enabling of the first or second control lines, respectively.

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