Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-11-21
2006-11-21
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S493000, C356S500000
Reexamination Certificate
active
07139080
ABSTRACT:
An apparatus including: a multi-axis interferometry system configured to receive an input beam and direct at least two beams derived from the input beam to contact different locations on a measurement object to monitor changes in an angular orientation of the measurement object; a beam steering assembly having a beam steering element positioned to direct the input beam into the interferometry system and a positioning system to selectively orient the beam steering element relative to the interferometry system; and a control circuit which during operation orients the beam steering element based on the changes in the angular orientation of the measurement object monitored by the interferometry system.
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Bennett, S.J., “A Double-passed Michelson Interferometer,”Optics Communications, 4:428-430, Feb./Mar. 1972.
Hill Henry A.
Kreuzer Justin
Connolly Patrick
Toatley , Jr. Gregory J.
Zygo Corporation
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