Interferometry systems involving a dynamic beam-steering...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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C356S493000, C356S500000

Reexamination Certificate

active

07139080

ABSTRACT:
An apparatus including: a multi-axis interferometry system configured to receive an input beam and direct at least two beams derived from the input beam to contact different locations on a measurement object to monitor changes in an angular orientation of the measurement object; a beam steering assembly having a beam steering element positioned to direct the input beam into the interferometry system and a positioning system to selectively orient the beam steering element relative to the interferometry system; and a control circuit which during operation orients the beam steering element based on the changes in the angular orientation of the measurement object monitored by the interferometry system.

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Bennett, S.J., “A Double-passed Michelson Interferometer,”Optics Communications, 4:428-430, Feb./Mar. 1972.

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