Interferometry method based on the wavelength drift of an...

Details Interferometry method based on the wavelength drift of an... Interferometry method based on the wavelength drift of an...

2008-01-08

2008-01-08

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

07317541

ABSTRACT:
An interferometry method using a laser of nominally fixed—but unknown and changing—frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of the object. The wavelength is reconstructed from the sampled patterns using a correlation algorithm. The phase angle is determined using an n-bucket algorithm. After all of the complex information has been determined at all of the multiple wavelengths, the surface of the object is calculated using conventional interferometry techniques. Accordingly, laser drift—typically considered a negative attribute—is used positively.

REFERENCES:
patent: 5706085 (1998-01-01), Blossey et al.
patent: 5777742 (1998-07-01), Marron
patent: 5880841 (1999-03-01), Marron et al.
patent: 5907404 (1999-05-01), Marron et al.
patent: 5926277 (1999-07-01), Marron et al.
patent: 6359692 (2002-03-01), Groot
Patrick Sandoz et al, “Phase shifting methods for interferometers using laser-diode frequency-modulation”, Optics Communications, Dec. 1, 1996, pp. 227-231.
Masakazu Suematsu et al, “Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis”, Applied Optics, Oct. 1, 1991, pp. 4046-4055.
John Hayes, “Dynamic interferometry handles vibration”, Laser Focus World, Mar. 2002, p. 109.

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