Interferometric wavefront measurement

Details Interferometric wavefront measurement Interferometric wavefront measurement

1983-07-20

1986-06-10

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356359, G01B 902

Patent

active

045940037

ABSTRACT:
Apparatus is disclosed for the phase measurement of an interference pattern produced by an unequal path interferometer. The invention comprises in one embodiment the use of a diode laser light source whose wavelength is varied so that the phase difference between the two wavefronts producing the interference pattern is modulated by a known amount. The modulated interference pattern is photosensed with an imaging device, and the signals processed to provide a phase map representing the optical path difference between the reference and measurement wavefronts of the interferometer.

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