Optics: measuring and testing – By light interference – Having wavefront division
Reexamination Certificate
2008-03-28
2011-10-25
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Having wavefront division
Reexamination Certificate
active
08045178
ABSTRACT:
An interferometric tracking device is disclosed. A first grating is optically coupled to a second grading such that the second grating is rotationally offset from the first grating. Imaging optics are adapted to image light passing through the first and second gratings onto a focal plane array. A plurality of wedge plates are optically disposed between the imaging optics and the second grating, such that the wedge plates generate a plurality of spots on the FPA when light from a point source is incident upon the first grating.
REFERENCES:
patent: 4213706 (1980-07-01), Hill et al.
patent: 4472029 (1984-09-01), Hardy
patent: 4518854 (1985-05-01), Hutchin
patent: 4737621 (1988-04-01), Gonsiorowski et al.
patent: 5629765 (1997-05-01), Schmutz
patent: 5844232 (1998-12-01), Pezant
patent: 6634750 (2003-10-01), Neal et al.
patent: 6639683 (2003-10-01), Tumbar et al.
patent: 6707560 (2004-03-01), Naulleau et al.
patent: 6987255 (2006-01-01), Smith
patent: 7038791 (2006-05-01), Smith
patent: 7106457 (2006-09-01), Stahl et al.
patent: 7283251 (2007-10-01), Tansey
patent: 7333215 (2008-02-01), Smith
patent: 7477362 (2009-01-01), Asundi et al.
patent: 2004/0260506 (2004-12-01), Jones et al.
patent: 2005/0045801 (2005-03-01), Smith
patent: 2005/0278126 (2005-12-01), Rosakis et al.
patent: 2007/0038374 (2007-02-01), Belenkii et al.
patent: 2007/0070327 (2007-03-01), Asundi et al.
patent: 2007/0176077 (2007-08-01), Barchers
patent: 2008/0017784 (2008-01-01), Hoot et al.
patent: 2008/0075412 (2008-03-01), Vartuli et al.
patent: 2010/0002242 (2010-01-01), Hutchin
Connolly Patrick J
Connolly Bove & Lodge & Hutz LLP
Optical Physics Company
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